(all countries except USA, Canada, Mexico)
ROLAND ELECTRONIC GmbH
Otto-Maurer-Str. 17
D-75210 Keltern

Phone:	+49 (7236) 9392-0
Fax:	+49 (7236) 9392-33

(for USA, Canada, Mexico)

ROLAND INDUSTRIAL ELECTRONICS, L.P.
20126 Jefferson Court
Cleveland, OH 44149-5610
USA

Phone:	+1-216-344-0508
Fax:	+1-440-846-8632

Solarsensors

Applications
Dual layer detection system for crystalline solar wafers on the basis of an eddy current sensor. This sensor is integrated into flat vacuum grippers and can detect not only one but two or more crystalline solar wafers during lifting process. Depending on the degree of automation these multiple layouts are removed either manually or automatically from the line.

Features
• Eddy current measurement principle
• Sensor size M12x1 (WF12IG453S)
• For mounting in "Schmalz Wafer Gripper SWG" (WF14x15AQ453S)
• Very fast response time - less than 20 ms
• Analog output for connection to PLC

Technical data
Air gap region without restriction:	0 … 1.0 mm
Absolute largest air gap: ¹⁾	1.5 mm

Air gap variation during the measurement:
... Air gap 0.0 mm	< -0.0 / + 0.2 mm
... Air gap 1.0 mm	< +/- 0.2 mm
... Air gap to 1.4 mm	< +/- 0.1 mm

Analog signal latency of full scale:	< 20 ms

Power supply:	20 … 28 VDC
Supply current:	< 50 mA

Output voltage:	0/2 … 10 V
Output voltage load:	100 KΩ (min. 20 KΩ)
Output current:	0/4 ... 20 mA
Output current load:	50 Ω (min. 0 Ω / max. 300 Ω)

Temperature range:	+15 ... +45°C (in operation)
	-20 ... +70°C (storage)

Sensor weight:	25 g (WF12IG453S)
	40 g (WF14x15AQ453S)

Conformity:	CE

1) Larger air gaps can reduce the ability to detect the second layer dramatically

Applications