|
During the production of solar wafers strings, these crystalline wafers are automatically destacked with vacuum grippers. During this process more than one wafer can be inadvertently removed from the stack. If this duplication is not detected then the additional wafer will sooner or later fall down and burst in many pieces. This debris will ruin other wafer strings increasing unnecessarily the scrap rate.
In order to increase the uptime and the output the Roland Electronic company located in Germany has developed a dual layer detector for crystalline solar wafers.
The sensor is based on eddy current technology and features an integrated amplifier for the connection to an analog input of a PLC.
|
